1.Cheng, H.M.;
Shenyang Nat. Lab. for Mater. Sci., Chinese Acad. of Sci., Shenyang, China
This paper appears in: Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Issue Date : 14-16 Oct. 2010
On page(s): 49
Print ISBN: 978-1-4244-6645-0
References Cited: 7
INSPEC Accession Number: 11677737
Digital Object Identifier : 10.1109/IVESC.2010.5644354
Date of Current Version : 29 November 2010
2 .Ramon, M.E.; Gupta, A.; Corbet, C.; Ferrer, D.A.; Movva, H.C.P.; Carpenter, G.; Colombo, L.; Bourianoff, G.; Doczy, M.; Akinwande, D.; Tutuc, E.; Banerjee, S.K.;
Microelectron. Res. Center, Univ. of Texas at Austin, Austin, TX, USA
This paper appears in: Device Research Conference (DRC), 2011 69th Annual
Issue Date : 20-22 June 2011
On page(s): 123 - 124
ISSN : 1548-3770
E-ISBN : 978-1-61284-242-4
Print ISBN: 978-1-61284-243-1
INSPEC Accession Number: 12222082
Digital Object Identifier : 10.1109/DRC.2011.5994446
Date of Current Version : 12 September 2011
3 .Xiaochen Dong; Wei Huang; Peng Chen;
Key Lab. for Org. Electron. & Inf. Displays, Nanjing Univ. of Posts & Telecommun., Nanjing, China
This paper appears in: Nanotechnology, IEEE Transactions on
Issue Date : May 2011
Volume : 10 , Issue:3
On page(s): 467 - 471
ISSN : 1536-125X
References Cited: 35
INSPEC Accession Number: 11988328
Digital Object Identifier : 10.1109/TNANO.2010.2047263
Date of Publication : 05 April 2010
Date of Current Version : 10 May 2011
Sponsored by : IEEE Nanotechnology Council
4 .De Arco, L.G.; Yi Zhang; Kumar, A.; Chongwu Zhou;
Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA
This paper appears in: Nanotechnology, IEEE Transactions on
Issue Date : March 2009
Volume : 8 , Issue:2
On page(s): 135 - 138
ISSN : 1536-125X
References Cited: 17
Cited by : 19
INSPEC Accession Number: 10505211
Digital Object Identifier : 10.1109/TNANO.2009.2013620
Date of Publication : 20 January 2009
Date of Current Version : 10 March 2009
Sponsored by : IEEE Nanotechnology Council
5 .Kasry, A.; Tulevski, G.; Kuroda, M.A.; Bol, A.A.; Martyna, G.J.; Menges, B.; Oida, S.; El Ashry, M.; Copel, M.; Vyklicky, L.;
Egypt-IBM Nanotechnol. Res. Center (EGNC), Egypt
This paper appears in: Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Issue Date : 14-16 Oct. 2010
On page(s): 119 - 120
Print ISBN: 978-1-4244-6645-0
References Cited: 2
INSPEC Accession Number: 11677547
Digital Object Identifier : 10.1109/IVESC.2010.5644444
Date of Current Version : 29 November 2010
6 .Fei Liu; Tae Seok Seo;
Dept. of Chem. & Biomol. Eng., KAIST, Daejeon, South Korea
This paper appears in: Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
Issue Date : 17-20 Aug. 2010
On page(s): 696 - 699
ISSN : 1944-9399
E-ISBN : 978-1-4244-7031-0
Print ISBN: 978-1-4244-7033-4
References Cited: 11
INSPEC Accession Number: 11772776
Digital Object Identifier : 10.1109/NANO.2010.5697936
Date of Current Version : 20 January 2011
7 .Yanjie Wang; Bo-Chao Huang; Ming Zhang; Congqin Miao; Ya-Hong Xie; Woo, J.C.S.;
Dept. of Electr. Eng., UCLA, Los Angeles, CA, USA
This paper appears in: VLSI Technology (VLSIT), 2011 Symposium on
Issue Date : 14-16 June 2011
On page(s): 116 - 117
ISSN : 0743-1562
Print ISBN: 978-1-4244-9949-6
INSPEC Accession Number: 12192483
Date of Current Version : 15 August 2011
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